Particle Characterization
Whatever your particular particle characterization needs may be, look to us for the technology to meet them. Our instruments use techniques that include the Coulter principle, laser diffraction, light scattering and polarized intensity differential scattering (PIDS) to provide the data you require for your specific application(s).
Multisizer 4e Coulter Counter
- Overall sizing range 0.2 um-1,600 um
- 10 um aperture for micro particle measurement (0.2 um)
- Multiple security levels for 21 CFR Part 11 Compliance
- Complex sample analysis across wide particle size distribution range Quality assurance ready (multiple SOM/SOP configurations & V-check validation package)
LS 13 320 Particle Sizing Analyzer
- Particle size measurement ranging from 0.017 um to 2000 um
- Highest submicron resolutions, using polarized intensity differential scattering (PIDS)
- Tornado dry powder system Fiber Optic Spatial Filtering System
LS 13 320 XR Particle Size Analyzer
Analyzer
- Direct particle detection from 10 nm – 3,500 um • Automatically highlights pass/fail results for faster quality control
- Pre-configured methods deliver results with 3 clicks or less